Minutes, IBIS Quality Committee 01 December 2009 11-12 AM EST (8-9 AM PST) ROLL CALL Adam Tambone * Anders Ekholm, Ericsson Barry Katz, SiSoft Benny Lazer Benjamin P Silva Bob Cox, Micron * Bob Ross, Teraspeed Consulting Group Brian Arsenault David Banas, Xilinx * Eckhard Lenski, Nokia Siemens Networks Eric Brock Guan Tao, Huawei Technologies Gregory R Edlund Hazem Hegazy Huang Chunxing, Huawei Technologies John Figueroa John Angulo, Mentor Graphics Katja Koller, Nokia Siemens Networks Kevin Fisher Kim Helliwell, LSI Logic Lance Wang, IOMethodology Lijun, Huawei Lynne Green, Green Streak Programs * Mike LaBonte, Cisco Systems Mike Mayer, SiSoft Moshiul Haque, Micron Technology Muniswarareddy Vorugu, ARM Ltd Pavani Jella, TI Peter LaFlamme Randy Wolff, Micron Technology Radovan Vuletic, Qimonda Robert Haller, Enterasys Roy Leventhal, Leventhal Design & Communications Sherif Hammad, Mentor Graphics Tim Coyle, Signal Consulting Group Todd Westerhoff, SiSoft Tom Dagostino, Teraspeed Consulting Group Kazuyoshi Shoji, Hitachi Sadahiro Nonoyama Everyone in attendance marked by * NOTE: "AR" = Action Required. -----------------------MINUTES --------------------------- Mike LaBonte conducted the meeting. Call for opens and patent disclosures: - No one declared a patent. - Bob: The TS parser is just about ready - Mike: Reminder, there will be no meeting Dec 8 AR Review: - Mike notify ibis and ibis-quality lists about correlation discussions - Decided to wait until the schedule is more certain - Expected to discuss the checklist today - No meeting next week - Correlation discussion may resume Dec 15 - Bob: Tim Coyle has a webinar coming up, but not related to IBIS - Moshiul rework IQ checklist for IQ 2.0 - No report New items: Topics we could discuss: - Feature-selective verification - Whether to update the Accuracy Handbook - Should the IBIS librarian make changes for IQ? - Recommendations for test fixtures for golden waveforms - Bob: This is targeted toward a simulation based reference - Anders: Agree - Recommendations for content of IC vendor quality reports - Real system testing (Huawei is doing this) Accuracy Handbook discussion - Mike: Some of it belongs in the Cookbook - Bob: The Accuracy Handbook is a pretty good document as-is - It could be expanded - That would be a daunting task Mike showed the Accuracy Handbook - Table 2: - Mike: 3.4.4 and 3.4.7 have the same title - Maybe 3.4.7 uses a terminated fixture for open-drain - In general the measurements are in 3 categories: - 3.3 for IV measurements - 3.4 for VT measurements - 3.5 for capacitance measurements - Bob: This is good for basic technologies - Some technologies might need new tests - Differential test were a serious omission - Mike: Would like to see these expressed as [Test Load] - Anders: We are starting at the bottom, and should start at the top - We should define the types of correlation first - 3.2.3: - Mike: This gives only one way to get C_comp - Bob: Lance gave a presentation on other ways to do it - It is non-linear, C_comp changes with voltage - Anders: This is a cookbook discussion - Mike: Correlation and cookbook have different target audiences - Cookbook is for model makers only - Correlation is used by all: - Model makers must correlate - End users may compare against measurements - EDA vendors should automate golden waveform checking - 4.1: - Mike: We should not define correlation levels - There should not be pass-fail criteria for correlation - Bob: It may be possible to rescale a buffer for another corner - The practice of changing IBIS models to match lab sims is controversial - The SPICE source may be wrong - Blaming IBIS for not matching SPICE may not be fair - Anders: How does FSV fit into this? - It would add more columns to Table 3 - Mike: Should an IBIS file have buffers for testing only? - Some FSV tests might measure TX to RX timing - Anders: There could be a keyword to introduce the extra buffers - IBISCHK would have to not complain about them Meeting ended at 12:00 PM Eastern Time.